Field Emission Scanning Electron Microscope (FESEM) with Energy-Dispersive X-Ray (EDX)

Analysis: FESEM is a complementary technique for the investigation of surface morphology. It can be used in combination with EDX detectors which are able to identify the elemental composition of the sample.
Machine:  Zeiss Supra 35 VP and Hitachi TM3000 Tabletop
Software: SmartSEM ® (FESEM) and) APEX^TM (EDX)
Sample: Solid, Powder, liquid
Price per sample: FESEM (RM400, 3 magnifications), Tabletop SEM (RM180) and EDX (RM150, 3 points)